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老化系统

老化系统

规格: HiBIS
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产品说明: 光通讯测试
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咨询电话:13818411803

产品详情

PRODUCT FEATURES

   The Easy-Think Instrument Hi-BIS is designed for Chip, Bar, Die, and CoC burn-in and life test. 

· Independent temperature control for each individual drawer.

· Well designed thermal contaction.

· Excellent electrical stress protection network.

· Flexible fixture configurations for different product usage

· Compact and easy to use



APPLICATIONS

· Laser burn-in & life test

· LED burn-in & life test



Specification

老化系统1.jpg


HiBIS 产品资料(点击下载)

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